Download Analog Circuit Design: Sensor and Actuator Interface by Anton Bakker (auth.), J. H. Huijsing, Michiel Steyaert, PDF

By Anton Bakker (auth.), J. H. Huijsing, Michiel Steyaert, Arthur van Roermund (eds.)

ISBN-10: 1441952535

ISBN-13: 9781441952530

Analog Circuit Design comprises the contribution of 18 specialists from the thirteenth overseas Workshop on Advances in Analog Circuit layout. it's quantity thirteen within the profitable sequence of Analog Circuit Design.

It presents 18 very good overviews of analog circuit layout in: Sensor and Actuator Interfaces, built-in High-Voltage Electronics and gear administration, and Low-Power and High-Resolution ADC’s.

Analog Circuit Design is an important reference resource for analog circuits designers and researchers wishing to maintain abreast with the most recent advancements within the box. the educational insurance additionally makes it appropriate to be used in a sophisticated layout course.

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Read Online or Download Analog Circuit Design: Sensor and Actuator Interface Electronics, Integrated High-Voltage Electronics and Power Management, Low-Power and High-Resolution ADC’s PDF

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Additional info for Analog Circuit Design: Sensor and Actuator Interface Electronics, Integrated High-Voltage Electronics and Power Management, Low-Power and High-Resolution ADC’s

Example text

0 ~ : :: '! :: : : > : c : 0 ~ : : : •.......... l l"....................... ~~ rsenSöi:cöntröil l & power l l,. ~~:J Fig. 3: Template for a multi-sensor interface chip Owing to the large number of sensors, several auxiliary building blocks have to be inc1uded (power management, analog/digital test circuitry, test interface, biasing). In the template in Fig. 3, two separate interfaces are used: A slow serial interface is used to set parameters, perform calibration functions, and receive/transmit status information, whereas a fast dedicated interface is used to transmit the measured data.

The testing time is reduced by employing the scan chain to load a specific state that is needed for a certain test. Next, the chip is switched from scan mode to normal operation until the analog circuitry has settled to the final value. Finally, the results, which are stored in the output registers of the ADC, and some dedicated test registers are read out via the scan chain again. This method allows a rapid setting of the parameters as well as parallel testing of all sensor elements and their interface circuitry (details can be found in [16]).

The dis advantage of this amplifier is the resistive load, which has to be driven by 55 the sensor (Rb) and the second amplification stage of the OpAmp (Ra)' Furthermore, additional power is needed for the second differential input stage, which is needed for the common-mode feedback. , the switched capacitor L~-modulator in Fig. 10). Fig. 10 shows a circuit implementation of this amplifier, and summarizes its performance. Av 90 dB GBW 30 MHz thermal Noise 10nVhJHz 1/t corner trequency 30 kHz Fig.

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